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Investigation of the influence of the bias applied to phase electrodes on the thermal generation currents in charge-coupled devices

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Abstract

A study was made of the kinetics of thermal generation currents and of their dependence on the bias voltage applied to phase electrodes. A mechanism is proposed to explain the observed phenomena. The surface recombination velocity and the lifetime of the minority carriers are determined.

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Authors and Affiliations

  1. Institute of Geodesy, Aerial Photographic Survey and Cartography Engineers, Novosibirsk

    M. D. Blokh, Kh. I. Klyaus, Yu. N. Serdyuk & E. I. Cherepov

Authors
  1. M. D. Blokh
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  2. Kh. I. Klyaus
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  3. Yu. N. Serdyuk
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  4. E. I. Cherepov
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 12, pp. 14–18, December, 1980.

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Blokh, M.D., Klyaus, K.I., Serdyuk, Y.N. et al. Investigation of the influence of the bias applied to phase electrodes on the thermal generation currents in charge-coupled devices. Soviet Physics Journal 23, 995–998 (1980). https://doi.org/10.1007/BF00896440

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  • DOI: https://doi.org/10.1007/BF00896440

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