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Evaluation of the ion drift parameters in dielectric films from the dynamic current-voltage characteristics

  • Physics of Semiconductors and Dielectrics
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Soviet Physics Journal Aims and scope

Abstract

The nonequilibrium dynamic current-voltage characteristics of the MDM structure are analyzed on the basis of the exact numerical solution of the electrical transport equations with consideration of the drift and diffusion of the charge carriers in an electrically neutral dielectric with blocking electrodes. A new method is proposed for the evaluation of the charge carrier mobility μ from the position of the current maximum on the dynamic current-voltage characteristic curves. The role of the diffusion component of the current is evaluated.

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 1, pp. 87–94, January, 1984.

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Koikov, S.N., Rymsha, V.P. Evaluation of the ion drift parameters in dielectric films from the dynamic current-voltage characteristics. Soviet Physics Journal 27, 76–82 (1984). https://doi.org/10.1007/BF00896417

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  • DOI: https://doi.org/10.1007/BF00896417

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