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Effect of crystal surface defects on the scattering intensity of X rays

  • Solid State Physics
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Soviet Physics Journal Aims and scope

Abstract

The effect of surface defects on the intensity of scattered x rays is investigated. A method is proposed for the determination of the thickness of deformed surface layers.

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Authors and Affiliations

  1. Erevan State University, USSR

    P. A. Bezirganyan & V. G. Aslayan

Authors
  1. P. A. Bezirganyan
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  2. V. G. Aslayan
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 1, pp. 68–71, January, 1984.

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Bezirganyan, P.A., Aslayan, V.G. Effect of crystal surface defects on the scattering intensity of X rays. Soviet Physics Journal 27, 57–61 (1984). https://doi.org/10.1007/BF00896412

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  • DOI: https://doi.org/10.1007/BF00896412

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