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Possibility of contactless measurement of free charge carrier mobility in semiconductors by the uhf resonator method

  • Physics of Semiconductors and Dielectrics
  • Published:
Soviet Physics Journal Aims and scope

Abstract

A contactless method for measuring free charge carrier mobility in semiconductors using a uhf resonator is described. The method is based on the dependence of the Q of a quasistatic uhf resonator containing the semiconductor specimen on external magnetic field induction. Simple relationships are obtained which allow low determination of the magnetoresistive mobility from the change in Q of the external portion of the resonator under the action of a weak magnetic field.

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Authors and Affiliations

  1. V. D. Kuznetsov Siberian Physicotechnical Institute, Tomsk State University, USSR

    Yu. V. Medvedev & A. A. Skryl'nikov

Authors
  1. Yu. V. Medvedev
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  2. A. A. Skryl'nikov
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 7, pp. 28–31, July, 1985.

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Medvedev, Y.V., Skryl'nikov, A.A. Possibility of contactless measurement of free charge carrier mobility in semiconductors by the uhf resonator method. Soviet Physics Journal 28, 546–549 (1985). https://doi.org/10.1007/BF00896180

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  • DOI: https://doi.org/10.1007/BF00896180

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