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Anomalous tensoelectric effects in gallium arsenide tunnel diodes

  • Physics of Semiconductors and Dielectrics
  • Published:
Soviet Physics Journal Aims and scope

Abstract

Anomalous tensoelectric phenomena induced in a tunnel p-n junction by a concentrated load and by hydrostatic compression were studied. The anomalous tensoelectric effects are caused by the action of concentrators of mechanical stresses in the vicinity of the p-n junction, giving rise to local microplastic strain. Under the conditions of hydrostatic compression prolate inclusions ∿100–200 å long play the role of concentrators. Analysis of irreversible changes in the current-voltage characteristics of tunnel p-n junctions made it possible to separate the energy levels of the defects produced with plastic strain of gallium arsenide.

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 8, pp. 84–88, August, 1987.

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Alekseeva, Z.M., Vyatkin, A.P., Krivorotov, N.P. et al. Anomalous tensoelectric effects in gallium arsenide tunnel diodes. Soviet Physics Journal 30, 716–720 (1987). https://doi.org/10.1007/BF00895951

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  • DOI: https://doi.org/10.1007/BF00895951

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