Conclusions
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1.
On ground ends of silicon filamentary crystals prepared by the chemical transport reaction method in a closed system, a periodic system of impurity bands has been found, parallel to type {211} planes.
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2.
The bands discovered are unambiguously related to steps on the side faces of FC; they extend inside the crystal parallel to each other from incoming corners of all the steps.
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3.
The experimental data described confirm the two-stage growth model of filamentary crystals.
Literature cited
A. V. Sandulova, P. S. Bogoyavlenskii, and M. I. Dronyuk, Fiz. Tverd. Tela (Leningrad),5, 2580 (1969).
A. A. Shchetinin, A. F. Tatarenkov, A. I. Dunaev, and E. G. Andon'ev, in: Filamentary Crystals and Thin Films [in Russian], Proc. Second All-Union Conference (1974), Part I, Voronezh Polytechnical Institute, Voronezh (1975), p. 98.
R. Wagner, in: Single-Crystal Filaments and Reinforced Materials [Russian translation], Mir, Moscow (1973), p. 42.
M. Schreckenbach, Phys. Status Solidi,7, 225 (1964).
V. V. Voronkov, Crystal Growth [in Russian], Vol. 10, Nauka (1974), p. 23.
B. I. Boltaks, Diffusion in Semiconductors [in Russian], Fizmatgiz (1961), p. 264.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 119–121, April, 1979.
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Shchetinin, A.A., Dunaev, A.I., Tatarenkov, A.F. et al. Banded structure of filamentary silicon crystals. Soviet Physics Journal 22, 449–452 (1979). https://doi.org/10.1007/BF00895676
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DOI: https://doi.org/10.1007/BF00895676