Abstract
In this work the problem of the localness of the four-probe method of resistivity measurement in inhomogeneous semiconductor materials is examined. An analysis is conducted of the dependence of the localness of the four-probe method on the type of inhomogeneity of the sample in question and on the relative experimental error. The results obtained are presented in graphical form.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 10, pp. 39–43, October, 1973.
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Polyakov, N.N. On the localness of the four-probe method of semiconductor resistivity measurement. Soviet Physics Journal 16, 1371–1374 (1973). https://doi.org/10.1007/BF00894405
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DOI: https://doi.org/10.1007/BF00894405