Neutralizing a high-aperture metal-ion beam
It is found that secondary electrons ejected by the ions from the collector are responsible for neutralizing ∼300 μsec pulses of wide-aperture ion beams (about 100–300 cm2) formed by various metals and having current densities ji of about 10−2 A/cm2 and energy ɛi ≈100 keV. A negative potential ϕee=−500 V applied to the extracting electrode relative to the grounded collector improves substantially not only the beam neutralization in the transport section but also the ion generation efficiency in the accelerating gap.
KeywordsSecondary Electron Generation Efficiency Transport Section Beam Neutralization
Unable to display preview. Download preview PDF.
- 1.V. M. Bistritsky, A. N. Didenko, A. M. Tolopa, and Yu. P. Usov, IEEE Trans. Elec. Insul.,EI-20, No. 4, 789–792 (1985).Google Scholar
- 2.A. A. Goncharov, I. M. Protsenko, and M. P. Samkov, Zh. Tekh. Fiz.,56, No. 5, 931–935 (1986).Google Scholar
- 3.A. I. Aksenov, S. P. Bugaev, V. A. Emel'yanov, et al., Prib. Tekh. Éksp., No. 3, 139–142 (1987).Google Scholar
- 4.D. R. Akkerman, V. M. Bystritskii, Ya. B. Krasik, and A. M. Tolopa, Manuscript Deposited at VINIII December 4, 1984, No. 7708, Tomsk (1984).Google Scholar
- 5.M. B. Guseva and E. M. Dubinina, The Physical Principles of Solid-State Electronics [in Russian], Izd. Mosk. Gos. Univ., Moscow (1986).Google Scholar