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Electrical breakdown of anodic aluminum oxide

  • Physics of Semiconductors and Dielectrics
  • Published:
Soviet Physics Journal Aims and scope

Abstract

Results are presented from a study of electrical breakdown of anodic aluminum oxide in a constant field with a platinum pressure electrode. Statistical breakdown parameters and their dependence on the magnitude and polarity of the applied voltage are obtained. Field and temperature dependences of breakdown delay time τ over the interval 10−6–103 sec are determined. It is shown that the experimental τ(E) curves can be rectified (in two segments) in the coordinates log τ ∼ E−1. This indicates a possible contribution to the breakdown mechanism by both tunnel injection of electrons from the cathode and subsequent avalanche multiplication of electrons within the dielectric.

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 25–29, April, 1990.

In conclusion, the authors thank T. V. Shmidt and E. Ya. Khanin for assistance in the study.

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Laléko, V.A., Ershova, N.Y. Electrical breakdown of anodic aluminum oxide. Soviet Physics Journal 33, 301–304 (1990). https://doi.org/10.1007/BF00894207

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  • DOI: https://doi.org/10.1007/BF00894207

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