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Structure of the depletion region and the current-voltage characteristics of metal-semiconductor contacts with ohmic incorporations

  • Physics of Semiconductors and Dielectrics
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Soviet Physics Journal Aims and scope

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Literature cited

  1. V. I. Strikha and E. V. Buzaneva, Physical Foundations of Metal-Semiconductor Contact Reliability in Integrated Electronics [in Russian], Radio i Svyaz', Moscow (1987).

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Authors and Affiliations

  1. T. G. Shevchenko State University, Kiev

    V. A. Avramenko, G. V. Kuznetsov, V. I. Strikha & D. I. Sheka

Authors
  1. V. A. Avramenko
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  2. G. V. Kuznetsov
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  3. V. I. Strikha
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  4. D. I. Sheka
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 21–25, April, 1990.

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Avramenko, V.A., Kuznetsov, G.V., Strikha, V.I. et al. Structure of the depletion region and the current-voltage characteristics of metal-semiconductor contacts with ohmic incorporations. Soviet Physics Journal 33, 297–301 (1990). https://doi.org/10.1007/BF00894206

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  • DOI: https://doi.org/10.1007/BF00894206

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