Soviet Physics Journal

, Volume 24, Issue 12, pp 1131–1134 | Cite as

Determination of the quasicontinuous defect-energy distribution for a disordered insulator by thermally stimulated depolarization

  • Yu. A. Gorokhovatskii
Article
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Abstract

A method is described for determining the quasicontinuous energy distribution of the electrically active defects in a disordered insulator from a family of thermally stimulated depolarization-current curves as measured for various polarization temperatures. It is shown that the method is comparable in informativeness with the method of fractional thermally stimulated depolarization while it is technically simpler to operate. Results are presented from a study on the defect energy distributions in amorphous films of silicon monoxide.

Keywords

Silicon Energy Distribution Active Defect Polarization Temperature Amorphous Film 

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Copyright information

© Plenum Publishing Corporation 1982

Authors and Affiliations

  • Yu. A. Gorokhovatskii
    • 1
  1. 1.Moscow Electronic Engineering InstituteUSSR

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