Abstract
In most experiments the x-ray-interferometer moire bands take the form of curves which complicate the problem of reconstructing the distribution pattern of deformations in single-crystal blocks giving rise to such moirés. In the paper we consider the regularities in the variation of the interplane distances and relative rotations of these planes for which moiré lines close in form to the experimental ones are obtained.
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Literature cited
P. B. Hirsch et al., Electron Microscopy of Thin Crystals [Russian translation], Moscow.
A. Lang, Nature,220, 16 (1968).
G. R. Drmeyan and F. O. Éiramdzhyan, Izd. Akad. Nauk SSSR, Fiz.,24, No. 1 (1979).
F. O. Éiramdzhyan et al., Molodoi Nauch. Rabotnik EGU,18, 90 (1973).
F. O. Éiramdzhyan et al., Molodoi Nauch. Rabotnik EGU,2, 76 (1974).
R. M. James, Solid State Phys.,15, (1963).
M. Born and E. Wolf, Principles of Optics, 5th edn., Pergamon (1975).
Z. G. Pinsker, X-ray Crystal Optics [in Russian], Moscow (1982).
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 8–12, April, 1984.
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Bagdasaryan, R.I., Balyan, M.K., Éiramdzhyan, T.O. et al. The interpretation of x-ray interferometer moiré patterns. Soviet Physics Journal 27, 259–263 (1984). https://doi.org/10.1007/BF00893702
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DOI: https://doi.org/10.1007/BF00893702