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Four-probe measurements of the electrical conductivity of semiconductor layers containing inhomogeneous regions

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Abstract

The possibility of performing four-probe measurements of conductivity of semi-conductor layers containing inhomogeneous regions is evaluated. Exact formulas are obtained for determination of semiconductor conductivity for arbitrary position of the probe near a circular inhomogeneity, and for two probe positions near two circular inhomogeneities. An approximate formula is presented for use with semiconductors containing several inhomogeneous regions. Theory is compared with experimental results.

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Literature cited

  1. P. M. Hall and J. T. Koo, J. Appl. Phys.,38, No. 8, 3112 (1967).

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Authors and Affiliations

  1. Gor'kii Research Physicotechnical Institute, USSR

    V. I. Golubev, Yu. I. Yakunin, V. A. Ukhov & L. D. Buiko

Authors
  1. V. I. Golubev
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  2. Yu. I. Yakunin
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  3. V. A. Ukhov
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  4. L. D. Buiko
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 7, pp. 30–33, July, 1977.

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Golubev, V.I., Yakunin, Y.I., Ukhov, V.A. et al. Four-probe measurements of the electrical conductivity of semiconductor layers containing inhomogeneous regions. Soviet Physics Journal 20, 855–858 (1977). https://doi.org/10.1007/BF00893127

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  • DOI: https://doi.org/10.1007/BF00893127

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