Abstract
The results are presented of an investigation of the electrical characteristics of avalanche S-diodes based on a new type of structure (+-π-ν-n), which is obtained by diffusing iron in GaAs with n = 1.1017 cm−3. The diodes have regions of S-type negative differential resistance (NDR), for both bias polarities and have a number of other features by comparison with diodes based on the π-ν-n structures with fused contacts. We discuss the mechanism for the formation of the NDR region of the voltage-current characteristics of the diode.
Similar content being viewed by others
Literature cited
S. S. Khludkov, Izv. Vyssh. Uchebn. Zaved., Fiz., No. 10, 67 (1983).
S. S. Khludkov and O. P. Tolbanov, Fiz. Tekh. Poluprovodn.,14, No. 8, 1624 (1980).
S. S. Khludkov and O. P. Tolbanov, Fiz. Tekh. Poluprovodn.,14, No. 12, 2416 (1980).
R. A. Logan, A. G. Chynoweth, and B. G. Cohen, Phys. Rev.,128, 2518 (1962).
V. I. Gaman, V. M. Diamant, and G. M. Fuks, Fiz. Tekh. Poluprovodn.,13, No. 12, 2302 (1979).
V. A. Kuz'min and A. S. Kyuregyan, Radiotekh. Elektron.,20, No. 7, 1449 (1975).
V. N. Arutyunyan, Generation-Recombination Effects and Double Injection in Semiconductors [in Russian], AN Arm. SSR, Erevan (1977).
P. M. Karageorgii-Alkalaev and A. Yu. Leiderman, Photosensitivity in Semiconductor Structures with Deep Impurities [in Russian], Physics Institute, AN Uzbek. SSR, Tashkent (1981).
Author information
Authors and Affiliations
Additional information
Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 54–58, April, 1986.
Rights and permissions
About this article
Cite this article
Khludkov, S.S., Tolbanov, O.P. & Koretskii, A.V. Gallium arsenide avalanche-type S-diode based on a n+-π-ν-n structure. Soviet Physics Journal 29, 298–301 (1986). https://doi.org/10.1007/BF00893001
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF00893001