Skip to main content
Log in

Influence of elastic stress fields on the diffusional redistribution of impurities in silicon

  • Published:
Soviet Physics Journal Aims and scope

Abstract

The redistribution of boron in silicon under the action of elastic stress fields created by the diffusion of various impurities is investigated experimentally. It is shown that the diffusion of boron slows down in the elastic compression interval. The slowing effect intensifies with increasing absolute stress values. A model is proposed to account qualitatively for the experimental results.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

Literature cited

  1. D. Shaw (ed.), Atomic Diffusion in Semiconductors, Plenum Press, New York (1973).

    Google Scholar 

  2. V. A. Panteleev, T. S. Gugina, V. A. Murav'ev, and I. A. Frolov, in: Abstr. Third All-Union Conf. Physicochemical Foundations of the Doping of Semiconductor Materials [in Russian], Moscow (1975), p. 135.

  3. V. A. Panteleev, T. S. Gugina, V. A. Murav'ev, and I. A. Frolov, in: Abstr. Third All-Union Conf. Physicochemical Foundations of the Doping of Semiconductor Materials [in Russian], Moscow (1975), p. 167.

  4. J. A. Aboaf, J. Electrochem. Soc.,116, 1732 (1969).

    Google Scholar 

  5. S. Prussin, J. Appl. Phys.,32, 1876 (1961).

    Google Scholar 

  6. P. I. Baranskii, V. P. Klochkov, and I. V. Potykevich, Semiconductor Electronics. Properties of Materials [in Russian], Naukova Dumka, Kiev (1975).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 6, pp. 124–127, June, 1977.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Panteleev, V.A., Gugina, T.S. & Leonov, V.N. Influence of elastic stress fields on the diffusional redistribution of impurities in silicon. Soviet Physics Journal 20, 798–801 (1977). https://doi.org/10.1007/BF00892769

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00892769

Keywords

Navigation