Abstract
An approach for estimating the electron affinity using the method of dielectric formalism is developed. It is shown that the volume component of the electron affinity is related to the formation of exchange-correlation holes in the valence band. The interaction of an electron with this hole on the surface is responsible for the surface component. The relation obtained agrees satisfactorily with the rather meager experimental data available for semiconductors, and enables the electron affinity to be estimated for polycrystalline semiconductors for which there is no reference data. The calculation is carried out for 14 well-known semiconductors. In the case of metals, the relations obtained give the work function of the electron, which agrees, with a relative error of up to ±30%, with experimental data for the majority of elements.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 9, pp. 76–80, 1982.
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Nevolin, V.K. Electron affinity for intrinsic semiconductors. Soviet Physics Journal 25, 835–838 (1982). https://doi.org/10.1007/BF00892403
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DOI: https://doi.org/10.1007/BF00892403