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Probe-bar and multiprobe methods of measuring Hall mobility for nonuniform-in-depth semiconductor layers

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Literature cited

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Authors and Affiliations

  1. Gorkii Institute of Technical Physics, USSR

    N. I. Pavlov, V. L. Kon'kov & V. I. Golubev

Authors
  1. N. I. Pavlov
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  2. V. L. Kon'kov
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  3. V. I. Golubev
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, Vol. 15, No. 10, pp. 26–32, October, 1972.

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Pavlov, N.I., Kon'kov, V.L. & Golubev, V.I. Probe-bar and multiprobe methods of measuring Hall mobility for nonuniform-in-depth semiconductor layers. Soviet Physics Journal 15, 1404–1409 (1972). https://doi.org/10.1007/BF00892083

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  • DOI: https://doi.org/10.1007/BF00892083

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