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Effect of residual radiation-induced defects on characteristics of ion-implanted gallium arsenide p-n junctions

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 7, pp. 139–142, July, 1978.

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Azikov, B.S., Brudnyi, V.N., Vyatkin, A.P. et al. Effect of residual radiation-induced defects on characteristics of ion-implanted gallium arsenide p-n junctions. Soviet Physics Journal 21, 958–960 (1978). https://doi.org/10.1007/BF00892062

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  • DOI: https://doi.org/10.1007/BF00892062

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