Abstract
Electron-microscope investigations show that in the SiCl4,-H2 system at sufficiently high purity of the substrate surface and the gas-phase mixture in a low-temperature process, morphologically perfect epitaxial layers of silicon grow by a step-layer mechanism. Estimates are given for a number of parameters of the silicon-layer growth surface.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 2, pp. 59–63, February, 1979.
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Ivonin, I.V., Krasil'nikova, L.M., Lavrent'eva, L.G. et al. Growth mechanism for thin autoepitaxial silicon layers grown in a low-temperature chloride process. Soviet Physics Journal 22, 157–161 (1979). https://doi.org/10.1007/BF00892008
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DOI: https://doi.org/10.1007/BF00892008