Skip to main content
SpringerLink
Log in

Measurement of the surface recombination rate and lifetime of charge carriers in semiconductors by a contactless microwave resonator method

  • Physics of Semiconductors and Dielectrics
  • Published:
Soviet Physics Journal Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. G. N. Danilov, Yu. V. Medvedev, and A. S. Petrov, Prib. Tekh. Eksp., No. 3, 238 (1973).

    Google Scholar 

  2. A. S. Petrov and Yu. V. Medvedev, Collection of Information Materials. Creation of New Semiconductor Materials and Metals of High Frequency (Report to an Intern. Symp. on Semiconductor Metrics, USSR, Dec. 1974) [in Russian], No. 4, 173, Moscow (1976).

    Google Scholar 

  3. G. E. Dunaevskii, Yu. V. Medvedev, and A. S. Petrov, Scient. Works GIREDMET [in Russian], No. 102, 70, Moscow (1980).

    Google Scholar 

  4. Ong, Bauchover, Tse-Yun-Wei, Rev. Sci. Instr. [Russian translacion], 9, 87 (1981).

    Google Scholar 

  5. V. B. Akhmanaev, Yu. V. Medvedev, and A. S. Petrov, Elektron. Tekhn., Ser. I, Elektronika SVCh, No. 4(328), 48 (1981).

    Google Scholar 

  6. M. V. Detinko, Yu. V. Medvedev, and A. S. Petrov, Izv. Vyssh. Uchebn. Zaved., Fiz., No. 1, 60 (1982).

    Google Scholar 

  7. É. I. Rashba, Zh. Tekh. Fiz.,26, No. 7, 1415 (1956).

    Google Scholar 

  8. É. I. Rashba and M. K. Sheikman, Zh. Tekh. Fiz.,28, No. 9, 1883 (1958).

    Google Scholar 

  9. V. Ml Zykov and N. T. Yundta, Prib. Tekh. Eksp., No. 3, 138 (1981).

    Google Scholar 

  10. Usami Akira, Gintate Schinichi, and Kudo Bossi, Oyo Buturi,49, No. 12, 1192 (1980).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. V. D. Kuznetsov Siberian Physicotechnical Institute at Tomsk State University, USSR

    V. B. Akhmanaev, Yu. V. Lisyuk, Yu. V. Medvedev & A. S. Petrov

Authors
  1. V. B. Akhmanaev
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Yu. V. Lisyuk
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Yu. V. Medvedev
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. A. S. Petrov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 6, pp. 79–84, June, 1983.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Akhmanaev, V.B., Lisyuk, Y.V., Medvedev, Y.V. et al. Measurement of the surface recombination rate and lifetime of charge carriers in semiconductors by a contactless microwave resonator method. Soviet Physics Journal 26, 569–574 (1983). https://doi.org/10.1007/BF00891934

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00891934

Keywords

Search

Navigation