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Mechanism of “healing” of defects in thin dielectric Ta2O5 films

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Literature cited

  1. P. J. Harrop and D. S. Campbell, in: L. I. Maissel and R. Glang (editors), Handbook of Thin Film Technology, McGraw-Hill, New York (1970).

    Google Scholar 

  2. V. I. Karasev and A. I. Korobov, Proceedings of All-Union Conference on Physics of Dielectrics and Prospects of Its Development [in Russian], Vol. 3 (1973), p. 104.

    Google Scholar 

  3. V. A. Fogel', Electronic Technology [in Russian], Semiconductor Devices Series, No. 1 (1971), p. 58.

    Google Scholar 

  4. L. Holland, Thin Film Microelectronics, Chapman and Hall, London (1965).

    Google Scholar 

  5. K. L. Chopra, Thin Film Phenomena, McGraw-Hill, New York (1969).

    Google Scholar 

  6. V. A. Vedernikov and T. I. Danilina, Mikroelektronika,2, No. 3, 248 (1973).

    Google Scholar 

  7. L. Young, Anodic Oxide Films, Academic Press, New York (1961).

    Google Scholar 

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 6, pp. 96–98, June, 1979.

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Motoshkin, V.V., Mukhachev, V.A. & Miller, A.A. Mechanism of “healing” of defects in thin dielectric Ta2O5 films. Soviet Physics Journal 22, 651–653 (1979). https://doi.org/10.1007/BF00891562

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  • DOI: https://doi.org/10.1007/BF00891562

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