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Determination of the hall coefficient of semiconductor specimens with asymmetric siting of a four-probe tester

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Literature cited

  1. V. L. Kon'kov, Fiz. Tverd. Tela,6, 308 (1964).

    Google Scholar 

  2. M. G. Buchler and C. L. Pearson, SSE,9, No. 5, 395 (1966).

    Google Scholar 

  3. M. G. Buchler, SSE,10, No. 8, 801 (1967).

    Google Scholar 

  4. M. P. Albert and J. E. Combs, IEEE Trans., El. Dev.ED-11, 148 (1964).

    Google Scholar 

  5. A. Peyre-Lavigne, J. Casanovas, D. Blanc, A. M. Chapuis, and G. Sondain, L'Onde Électrique,48, 490, 37 (1968).

    Google Scholar 

  6. N. N. Polyakov, A. S. Kukui, V. I. Golubev, and N. I. Pavlov, Izv. AN SSSR, Ser. Fiz., No. 3 (1972).

  7. I. G. Petrovskii, Lectures on Partial Differential Equations [in Russian], Fizmatgiz, Moscow (1961), Chapter 2.

    Google Scholar 

  8. L. J. Van der Pauw, Philips Techn. Rev.,20, No. 8, 220 (1958–59).

    Google Scholar 

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Authors and Affiliations

  1. Gor'kii Research Physico-Technical Institute, USSR

    V. I. Golubev & A. I. Emel'yanov

Authors
  1. V. I. Golubev
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  2. A. I. Emel'yanov
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 8, pp. 64–67, August, 1973.

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Golubev, V.I., Emel'yanov, A.I. Determination of the hall coefficient of semiconductor specimens with asymmetric siting of a four-probe tester. Soviet Physics Journal 16, 1090–1093 (1973). https://doi.org/10.1007/BF00890462

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  • DOI: https://doi.org/10.1007/BF00890462

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