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Soviet Physics Journal

, Volume 16, Issue 11, pp 1563–1567 | Cite as

Radiographic analysis of the structures of films obtained by vacuum sputtering of some copper-based low alloys

  • M. V. Belous
  • É. I. Guivan
  • V. I. Popov
  • V. G. Tinyaev
  • V. K. Shcherbik
Article
  • 10 Downloads

Abstract

Diffractometric phase analysis of the structures of alloys on copper base, containing small concentrations of Mn, Pd, Al, Ti, Zr, Ce, and Ni, and of films on their base, was carried out. The differences in the structure of initial bulk samples of the alloys, and of condensates obtained by sputtering in vacuum, are discussed.

Keywords

Copper Phase Analysis Bulk Sample Small Concentration Radiographic Analysis 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Literature cited

  1. 1.
    L. S. Palatnik, M. Ya. Fuks, O. G. Alaverdova, A. I. Il'inskii, and P. G. Gevlich, Fiz. Met. i Metal.,23, No. 5, 892 (1967).Google Scholar
  2. 2.
    M. Candais, Revue d'Optique,40, No. 6, 306; No. 9, 464 (1967).Google Scholar
  3. 3.
    U. S. Urazaliev, O. E. Bondarenko, R. D. Ivanov, and L. A. Panin, Élektr. Tekh., Ser. VI, No. 4, 14 (1968).Google Scholar
  4. 4.
    G. F. Vasil'ev, A. F. Andrushko, V. A. Meshkov, and E. I. Sukhinina, Élektr. Tekh., Ser. VI, No. 4, 20 (1968).Google Scholar
  5. 5.
    M. V. Belous, A. M. Korol'kov, A. S. Kosenkov, E. V. Lysova, G. I. Pavlenko, V. I. Popov, and V. N. Chugaev, Élektr. Tekh., Ser.10, No. 3, 18 (1971).Google Scholar
  6. 6.
    S. S. Gorelik, L. N. Rastorguev, and Yu. A. Skakov, Radiographic and Electron Diffraction Analysis of Metals (Applications) [in Russian], Metallurgizdat (1963).Google Scholar
  7. 7.
    M. V. Belous, A. M. Korol'kov, A. S. Kosenkov, E. V. Lysova, G. I. Pavlenko, and V. I. Popov, Fiz. i Khtm. Obr. Mater., No. 3, 38 (1971).Google Scholar
  8. 8.
    K. L. Chopra, Thin Film Phenomena, Pergamon Press, New York-London (1970).Google Scholar
  9. 9.
    W. A. Jesser, I. W. Matthews, D. Kuhlman, and Wilsdorf, Appl. Phys. Letters,9, 176 (1968).Google Scholar
  10. 10.
    R. W. Vook, T. Parker, and D. Wright, in: Surfaces and Interfaces Chemical and Physical Characteristics, Syracuse Univ. Press (1967), p. 347.Google Scholar
  11. 11.
    M. Ya. Fuks, Filamentary Crystals and Nonferromagnetic Films [in Russian], Pt. II, Voronezh (1970), p. 34.Google Scholar
  12. 12.
    U. Zwicker, Z. Metallkunde,53, 709 (1962).Google Scholar
  13. 13.
    I. K. Duisemaliev and A. A. Presnyakov, Zh. Neorg. Khim.,9, No. 9 (1964).Google Scholar
  14. 14.
    M. Hansen and K. Anderko, The Structure of Binary Alloys [Russian translation], Vols. 1 and 2, Metallurgizdat (1962).Google Scholar
  15. 15.
    K. Dies, Kupfer und Kupferlegierungen in der Technik, Springer Verlag, Berlin (Heidelberg), New York (1967).Google Scholar
  16. 16.
    A. E. Vol, Structure and Properties of Binary Metallic Systems [in Russian], Vols. 1 and 2, Fizmatgiz, Moscow (1959, 1962).Google Scholar
  17. 17.
    Ya. S. Umanskii, Radiography of Metals and Semiconductors [in Russian], Metallurgiya, Moscow (1969).Google Scholar
  18. 18.
    G. V. Samsonov (editor), Physicochemical Properties of Elements. Handbook [in Russian], Naukova Dumka, Izd. AN UkrSSR, Kiev (1965).Google Scholar

Copyright information

© Plenum Publishing Corporation 1975

Authors and Affiliations

  • M. V. Belous
    • 1
  • É. I. Guivan
    • 1
  • V. I. Popov
    • 1
  • V. G. Tinyaev
    • 1
  • V. K. Shcherbik
    • 1
  1. 1.Kiev Polytechnic InstituteUSSR

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