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Measurement of optical absorption in dielectric reflectors

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Abstract

The absorption of optical coatings can be measured by the method described with an accuracy of 0.001%. The radiation absorbed by the optical coating causes a change in the temperature of the coating and the substrate. The temperature change is measured by means of a thin-film resistance thermometer deposited on the substrate. The method was tested for laser reflectors at 1060 nm with a laser as a light source.

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References

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Ahrens, H., Welling, H. & Scheel, H.E. Measurement of optical absorption in dielectric reflectors. Appl. Phys. 1, 69–71 (1973). https://doi.org/10.1007/BF00886806

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  • DOI: https://doi.org/10.1007/BF00886806

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