Abstract
This review paper is concerned with the imaging properties and major uses of scanning optical microscopes. It is shown that the confocal scanning microscope exhibits a form of super-resolution and that the instrument in general has great application in nonlinear microscopy and the inspection of electronic devices.
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References
J.Z.Young, F.Roberts: Nature167, 231 (1951)
P.Montgomery, F.Roberts, W.Bonner: Nature177, 1172 (1956)
V.K.Zworykin, F.L.Hatke: Science126, 805 (1957)
J.J.Freed, J.L.Engle: Ann. N.Y. Acad. Sci.97, 412 (1962)
R.C.Mellors, R.Silver: Science114, 356 (1951)
H.C.Box, H.Freund: Rev. Sci. Instrum.30, 28 (1959)
J.A.Dobrowolski, W.Godfrey, P.N.Slater, W.Weinstein: J. Opt. Soc. Am.47, 186 (1957)
P.N.Slater: J. Opt. Soc. Am.49, 562 (1959)
W.T.Welford: InOptics in Metrology, ed. by P.Mollet (Pergamon Press, Oxford 1960)
J.Lekavich, G.Hrbek, W.Watson: “Electro-optical Systems Design Conference”. New York City (1970)
B.Sherman, J.F.Black: Appl. Opt.9, 802 (1970)
A.Korpel, R.L.Whitman: Appl. Opt.8, 1577 (1969)
T.Sawatari: Appl. Opt.12, 2768 (1973)
P.A.Franken, A.E.Hill, C.N.Peters, G.W.Weinreich: Phys. Rev. Lett.7, 118 (1961)
T.Wilson, J.N.Gannaway: Optik54, 201 (1979)
K.Murata: “Instruments for the measuring of optical transfer functions”, Progr. Opt.5, 199 (1966)
C.J.R.Sheppard, A.Choudhary: Opt. Acta24, 1051 (1977)
C.J.R.Sheppard, T.Wilson: Opt. Acta25, 315 (1978)
G.J.Brakenhoff: Int. Comm. Opt. Madrid (1978)
R.A.Lemons, C.F.Quate: Appl. Phys. Lett24, 163 (1974)
T.Wilson: Oxford Univ. Eng. Lab. Report 1243/78 (1978)
J.N.Gannaway, C.J.R.Sheppard, T.Wilson: UKAEA Diffraction Analysis Conference, ND-R-337(5), 17 (1978)
T.Wilson, D.K.Hamilton, P.J.Shadbolt, B.Dodd: Met. Sci.144 (April 1980)
T.Wilson, J.N.Gannaway, C.J.R.Sheppard: To be published
A.Yariv:Quantum Electronics (Wiley, New York 1967)
R.Hellwarth, P.Christensen: Opt. Commun.12, 318 (1974)
J.N.Gannaway, C.J.R.Sheppard: Opt. Quant. Electron.10, 435 (1978)
J.N.Gannaway, T.Wilson: Proc. R. Microsc. Soc.14, 170 (1979)
R.Kompfner, R.A.Lemons: Appl. Phys. Lett.28, 295 (1976)
T.Wilson, C.J.R.Sheppard: Opt. Actor26, 761 (1979)
C.J.R.Sheppard, R.Kompfner: Appl. Opt. 2879 (1978)
J.N.Gannaway, T.Wilson: Electron. Lett.14, 507 (1978)
D.B.Holt:Quantitative Scanning Electron Microscopy (Academic Press, New York 1974)
T.Wilson, W.Osicki, J.N.Gannaway, G.R.Booker: J. Mater Sci.14, 961 (1979)
W.C.Dash, R.Newman: Phys. Rev.99, 1151 (1955)
T.Wilson, J.N.Gannaway, P.Johnson: J. Microscopy118, Pr3, 309 (1980)
T.H.Distephano, J.J.Cuomo: Appl. Phys. Lett.30, 351 (1977)
D.V.Lang, C.H.Henry: Solid State Electron.21, 1519 (1978)
M.Minsky: U.S. Patent 3013467, Microscopy apparatus Dec. 19 (1961) (filled Nov. 7, 1957)
M.D.Egger, M.Petran: Science157, 305 (1967)
P.Davidovits, M.D.Egger: Nature223, 831 (1969)
C.J.R.Sheppard, T.Wilson: Opt. Lett.3, 115 (1978)
C.J.R.Sheppard, T.Wilson: Optik (1980, in press)
C.J.R.Sheppard, T.Wilson: J. Microsc.114, 179 (1978)
W.Welford: J. Opt. Soc. Am.50, 749 (1960)
H.H.Hopkins: Proc. R. Soc. A217, 408 (1953)
C.J.R.Sheppard, T.Wilson: Appl. Opt.18, 7 (1979)
C.J.R.Sheppard, T.Wilson: Philos. Trans. R. Soc.295, 513 (1980)
C.J.R.Sheppard, T.Wilson: Appl. Opt.18, 3764 (1979)
T.Wilson, C.J.R.Sheppard: J. Opt. Soc. Am.69, 1443 (1979)
G.J.Brakenhoff: Int. Comm. Optics (1978)
C.J.R.Sheppard, T.Wilson: Opt. Acta (1980, in press)
M.E.Cox: InInterpretive Techniques for Microstructural Analysis (Plenum Press, New York 1977)
T.Wilson, C.J.R.Sheppard: S.P.I.E. Int. Opt. Comp. Conf. Washington D.C. (1980)
M.D.Egger, M.Petran: Science157, 305 (1967)
M.Petran, M.Hadravsky, M.D.Egger, R.Galambos: J. Opt. Soc. Am.58, 661 (1968)
C.J.R.Sheppard, T.Wilson: To be published