Abstract
Results of a two-dimensional numerical modeling of a single-collector I2L element with thermal effects taken into account are described.
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Translated from Inzhenero-Fizicheskii Zhurnal, Vol. 54, No. 5, pp. 823–828, May, 1988.
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Abramov, I.I., Kharitonov, V.V. Numerical analysis of functionally integrated VLSI elements with thermal effects taken into account. III. Results of modeling. Journal of Engineering Physics 54, 565–568 (1988). https://doi.org/10.1007/BF00872579
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DOI: https://doi.org/10.1007/BF00872579