Journal of engineering physics

, Volume 51, Issue 1, pp 864–869 | Cite as

Numerical analysis of transfer phenomena in semiconductor devices and structures 1. Universal program for two-dimensional modeling

  • I. I. Abramov
  • V. V. Kharitonov


A universal program for the two-dimensional numerical analysis of functionally integrated structures of integral circuits is described.


Statistical Physic Semiconductor Device Transfer Phenomenon Integral Circuit Universal Program 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Plenum Publishing Corporation 1987

Authors and Affiliations

  • I. I. Abramov
    • 1
  • V. V. Kharitonov
    • 1
  1. 1.Belorussian Institute of Railroad EngineersGomel'

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