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Analog method of measuring the derivatives of current-voltage characteristics of semiconducting devices

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Measurement Techniques Aims and scope

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Literature cited

  1. I. E. Voronkov, S. P. Khodnevich, and A. D. Khodnevich, Electronic Engineering. Quality Control, Metrology, Standardization [in Russian], No. 5, 11 (1980).

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  3. V. A. Shilo, Linear Integrated Circuits [in Russian], Sovetskoe Radio, Moscow (1979).

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Authors
  1. I. E. Voronkov
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  2. R. S. Petukhov
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  3. L. L. Svetlichnaya
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 4, pp. 55–56, April, 1990.

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Voronkov, I.E., Petukhov, R.S. & Svetlichnaya, L.L. Analog method of measuring the derivatives of current-voltage characteristics of semiconducting devices. Meas Tech 33, 387–389 (1990). https://doi.org/10.1007/BF00867837

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  • DOI: https://doi.org/10.1007/BF00867837

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