Skip to main content
SpringerLink
Log in

Analysis of calibration errors of a standard capacitance comparator

  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. V. N. Kolesov, A. A. Mamonov, and T. B. Ruban, in: Measurement of the Parameters of Electric Circuits with Lumped Components at High Frequencies [in Russian], Trudy VNIIM, Leningrad (1979), p. 66.

  2. A. R. Sheikin, in: Mathematical Methods in Applied Metrology [in Russian], Trudy VNIIM, Leningrad (1986), p. 68.

  3. S. B. Danilevich and A. A. Tsibina, in: Mathematical Methods in Applied Metrology [in Russian], Trudy VNIIM, Leningrad (1986), p. 59.

Download references

Authors
  1. V. N. Kolesov
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. R. Sheikin
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. S. B. Danilevich
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel'naya Tekhnika, No. 4, pp. 49–51, April, 1990.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Kolesov, V.N., Sheikin, A.R. & Danilevich, S.B. Analysis of calibration errors of a standard capacitance comparator. Meas Tech 33, 377–380 (1990). https://doi.org/10.1007/BF00867834

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00867834

Keywords

Search

Navigation