Skip to main content
SpringerLink
Log in

Scaling errors in measurements by processor measurement devices

  • Published:
Measurement Techniques Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. É. I. Sorenkov et al., The Accuracy of Computing Devices and Algorithms [in Russian], Mashinostroenie, Moscow (1976).

    Google Scholar 

Download references

Authors
  1. É. I. Tsvetkov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel'naya Tekhnika, No. 4, pp. 6–7, April, 1990.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Tsvetkov, É.I. Scaling errors in measurements by processor measurement devices. Meas Tech 33, 291–294 (1990). https://doi.org/10.1007/BF00867807

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00867807

Keywords

Search

Navigation