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Metrological surface scanning tunneling and atomic-force microscopy

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Measurement Techniques Aims and scope

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Authors
  1. S. I. Vasil'ev
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  2. V. M. Mostepanenko
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  3. V. I. Panov
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 1, pp. 19–22, January, 1990.

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Vasil'ev, S.I., Mostepanenko, V.M. & Panov, V.I. Metrological surface scanning tunneling and atomic-force microscopy. Meas Tech 33, 26–30 (1990). https://doi.org/10.1007/BF00866811

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  • DOI: https://doi.org/10.1007/BF00866811

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