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Photometric method of determining gold film thickness of nuclear radiation silicon detectors

  • Measurement of Ionizing Radiation
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. N. P. Podenko and É. K. Stepanov, Izmer. Tekh., No. 9, 105 (1971).

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  2. R. M. Azzam and M. Bashara, Ellipsometry and Polarized Light, Elsevier (1981).

  3. A. M. Vasil'ev et al., Fiz. Tekh. Poluprovodn.,3, No. 8, 1276 (1969).

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Authors
  1. B. A. Nikitin
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  2. D. V. Zakharchuk
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  3. I. I. Kovalev
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  4. T. V. Nikolaeva
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  5. E. S. Serushkina
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 2, pp. 52–53, February, 1987.

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Nikitin, B.A., Zakharchuk, D.V., Kovalev, I.I. et al. Photometric method of determining gold film thickness of nuclear radiation silicon detectors. Meas Tech 30, 196–198 (1987). https://doi.org/10.1007/BF00865879

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  • DOI: https://doi.org/10.1007/BF00865879

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