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Admittance of measuring cell with a dielectric sample

  • Measurement of Electric and Magnetic Quantities
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Measurement Techniques Aims and scope

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Literature cited

  1. B. I. Shvidchenko et al., in: Metrology and Precision Measurements [in Russian], Vol. 12 (111) (1976), p. 20.

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  2. S. N. Sibirtsev et al., Materials of the All-Union Institute of Physicotechnical and Radio-Engineering Measurements, “Measurement of electromagnetic parameters of radio-engineering materials at hf and shf frequencies,” [in Russian] (1981), p. 45.

  3. V. F. Matveichuk, in: Materials of the 5th All-Union Conf. on Methods and Facilities for measuring the Electromagnetic Properties of Materials at hf and shf Frequencies [in Russian], SNIIM, Novosibirsk (1983), p. 89.

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  4. L. D. Gol'dshtein and N. V. Zernov, Electromagnetic Fields and Waves [in Russian], Sov. Radio, Moscow (1971).

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  5. V. F. Matveichuk et al., in: 4th All-Union Conf. on Metrology in Radioelectronics [in Russian], Moscow (1978), p. 100.

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Authors
  1. V. F. Matveichuk
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 1, pp. 52–53, January, 1987.

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Matveichuk, V.F. Admittance of measuring cell with a dielectric sample. Meas Tech 30, 90–92 (1987). https://doi.org/10.1007/BF00865738

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  • DOI: https://doi.org/10.1007/BF00865738

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