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Additional information
Translated from Izmeritel'naya Tekhnika, No. 2, pp. 53–55, February, 1988.
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Bondarchuk, A.B., Goisa, S.N., Koval', I.F. et al. Investigation of semiconductor surface disorder by disappearance-potential spectroscopy. Meas Tech 31, 179–181 (1988). https://doi.org/10.1007/BF00864264
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DOI: https://doi.org/10.1007/BF00864264