Literature cited
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Additional information
Translated from Izmeritel'naya Tekhnika, No. 2, pp. 11–13, February, 1988.
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Tsvetkov, É.I., Sobolev, V.S. & Lubochkin, M.M. Formal description of processor-based measuring instruments for automatic analysis of their metrological properties. Meas Tech 31, 104–107 (1988). https://doi.org/10.1007/BF00864238
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DOI: https://doi.org/10.1007/BF00864238