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Noise methods of measuring the parameters of semiconductor materials and devices

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Measurement Techniques Aims and scope

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Literature cited

  1. H. J. Hoffmann and W. Sohn, Phys. Status Solidi (a),44, No. 1, 237 (1977).

    Google Scholar 

  2. H. J. Hoffman and E. Huber, Physica (B+C),111, No. 2, 3, 249 (1981).

    Google Scholar 

  3. K. M. Van Vliet and J. R. Fasset, in: Fluctuation Phenomena in Solids, Academic Press, New York-London (1965).

    Google Scholar 

  4. A. van der Zil, Fluctuation Phenomena in Semiconductors [Russian translation], IL, Moscow (1961).

    Google Scholar 

  5. K. Lee et al., Solid State Electron.,25, No. 10, 999 (1982).

    Google Scholar 

  6. F. M. Klaasen et al., Physica,27, No. 1, 48 (1961).

    Google Scholar 

  7. L. J. Neuringer and W. Bernard, J. Phys. Chem. Sol.,22, No. 12, 385 (1961).

    Google Scholar 

  8. V. A. Besfamil'naya and V. V. Ostroborodova, Fiz. Tverd. Tela,6, No. 12, 3745 (1964).

    Google Scholar 

  9. V. V. Proklov et al., Fiz. Tverd. Tela,7, No. 1, 326 (1965).

    Google Scholar 

  10. G. Bosman and R. J. J. Zijlstra, Solid State Electron.,25, No. 4, 273 (1982).

    Google Scholar 

  11. A. M. Svetlichnyi et al., Fiz. Tekh. Poluprovodn.,14, No. 3, 582 (1980).

    Google Scholar 

  12. M. G. Andrukhiv et al., Fiz. Tekh. Poluprovodn.,14, No. 3, 572 (1980).

    Google Scholar 

  13. M. G. Andrukhiv et al., Fiz. Tekh. Poluprovodn.,16, No. 6, 1119 (1982).

    Google Scholar 

  14. D. A. Evants and P. T. Landsberg, Proc. R. Soc.,A267, No. 1331, 474 (1962).

    Google Scholar 

  15. J. A. Copeland, IEEE Trans. Electron Dev.,ED-18, No. 1, 59 (1971).

    Google Scholar 

  16. F. M. Klaassen et al., Physica,27, No. 2, 185 (1961).

    Google Scholar 

  17. J. E. Hill and K. M. Van Vleit, J. Appl. Phys.,29, No. 2, 177 (1958).

    Google Scholar 

  18. N. B. Luk'yanchikova et al., Fiz. Tekh. Poluprovodn.,15, No. 2, 336 (1981).

    Google Scholar 

  19. N. B. Luk'yanchikova, D. Sc. Thesis, IP Akad. Nauk Ukr. SSR, Kiev (1976).

    Google Scholar 

  20. N. B. Luk'yanchikova, Lit. Fiz. Sb.,20, No. 5, 25 (1980).

    Google Scholar 

  21. N. B. Luk'yanchikova, Elektron. Prom., 6(123), 28 (1983).

    Google Scholar 

  22. P. O. Lauritzen, Solid State Electron.,8, No. 1, 41 (1965).

    Google Scholar 

  23. L. D. Yau and C. T. Sah, IEEE Trans. Electron Devices,ED-16, No. 1, 170 (1969).

    Google Scholar 

  24. N. B. Luk'yanchikova et al., Lit. Fiz. Sb.,21, No. 1, 89 (1981).

    Google Scholar 

  25. V. Bareikis et al., in: Hot-Electron Diffusion [in Russian], Mosklas, Vilnius (1981).

    Google Scholar 

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Authors
  1. N. B. Luk'yanchikova
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Translated from Izmeritel'naya Tekhnika, No. 4, pp. 58–60, April, 1986.

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Luk'yanchikova, N.B. Noise methods of measuring the parameters of semiconductor materials and devices. Meas Tech 29, 356–359 (1986). https://doi.org/10.1007/BF00864116

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  • DOI: https://doi.org/10.1007/BF00864116

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