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Minimizing the nonlinearity error in the static characteristics of a semiconductor thermistor thermometer

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Measurement Techniques Aims and scope

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Literature cited

  1. G. A. Lushchaev et al., Izmerit. Tekhn., No. 10, 54–56 (1975).

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  2. G. A. Lushchaev et al., Izmerit. Tekhn., No. 8, 51–52 (1984).

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  3. G. K. Nechaev and N. P. Udalov, Relays and Sensors Containing Semiconductor Thermistors [in Russian], Gosenergoizdat, Moscow-Leningrad (1961).

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  4. Art Burke, “Linearizing thermistors with a single resistor,” Electronics,54, No. 11, 61–66 (1981).

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  5. Statement of Method No. 242 on Calibrating Technical Semiconductor Resistance Thermometers in the Temperature Range from −100 to +300°C [in Russian], Standartov, Moscow (1973).

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Authors
  1. G. A. Lushchaev
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  2. E. I. Fandeev
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  3. Yu. I. Kanyuka
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  4. V. A. Karchkov
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  5. V. A. Skorchenko
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 8, pp. 40–41, August, 1986.

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Lushchaev, G.A., Fandeev, E.I., Kanyuka, Y.I. et al. Minimizing the nonlinearity error in the static characteristics of a semiconductor thermistor thermometer. Meas Tech 29, 757–760 (1986). https://doi.org/10.1007/BF00863964

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  • DOI: https://doi.org/10.1007/BF00863964

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