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Measurement Techniques

, Volume 29, Issue 9, pp 890–893 | Cite as

Low-background semiconductor spectrometer

  • Yu. G. Zdesenko
  • A. B. Kostezh
  • B. N. Kropivyanskii
  • V. N. Kuts
  • I. A. Mytsyk
  • A. S. Nikolaiko
Measurements of Ionizing Radiation

Keywords

Physical Chemistry Analytical Chemistry Semiconductor Spectrometer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Literature cited

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    C. Liguori et al., Nucl. Instrum. Meth.,204, 585 (1983).Google Scholar
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    E. Bellotti et al., Phys. Lett.,121B, 72 (1983).Google Scholar
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    Yu. G. Zdesenko et al., Prib. Tekh. Éksp., No. 5, 47 (1979); No. 5, 77 (1982).Google Scholar
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    Yu. G. Zdesenko et al., Izv. AN SSSR, Ser. Fiz.,44, No. 9, 1870 (1980);45, No. 10, 1856 (1981);47, No. 5, 839 (1983).Google Scholar
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    C. Lederer and M. Shirley, Table of Isotopes, Wiley (1978).Google Scholar

Copyright information

© Plenum Publishing Corporation 1987

Authors and Affiliations

  • Yu. G. Zdesenko
  • A. B. Kostezh
  • B. N. Kropivyanskii
  • V. N. Kuts
  • I. A. Mytsyk
  • A. S. Nikolaiko

There are no affiliations available

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