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New effects in charged He II and their possible applications in metrology

  • General Problems of Metrology and Measurement Techniques
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Measurement Techniques Aims and scope

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Literature cited

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Translated from Izmeritel'naya Tekhnika, No. 9, pp. 3–4, September, 1986.

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Starinskii, V.N., Trunov, N.N. New effects in charged He II and their possible applications in metrology. Meas Tech 29, 793–796 (1986). https://doi.org/10.1007/BF00863280

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  • DOI: https://doi.org/10.1007/BF00863280

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