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Study of formation of thin-film Josephson circuits for metrology

  • Measurement of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

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Authors
  1. S. I. Andreev
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  2. T. N. Musta
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  3. S. V. Potapov
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  4. T. V. Yashina
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 10, pp. 45–47, October, 1986.

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Andreev, S.I., Musta, T.N., Potapov, S.V. et al. Study of formation of thin-film Josephson circuits for metrology. Meas Tech 29, 973–975 (1986). https://doi.org/10.1007/BF00862458

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  • DOI: https://doi.org/10.1007/BF00862458

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