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Measurement of the parameters of infralow-frequency voltages in the verification of profilometers and profilographs

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Measurement Techniques Aims and scope

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Literature cited

  1. GOST 8.241-77. GSI. System M Contacting Profilometers. Verification Methods and Tools [in Russian].

  2. GOST 8.242-77. GSI. Profilographs. Verification Methods and Tools [in Russian].

  3. I22.710.002T0. General-Purpose Voltmeter. Technical Description and Operating Instructions [in Russian].

  4. R. G. Karpov and N. R. Karpov, Electrical and Radio Measurements [in Russian], Vysshaya Shkola, Moscow (1978).

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  5. M. I. Maklyukov and V. A. Protopopov, Application of Analog Integrated Circuit in Computing Devices [in Russian], Énergiya, Moscow (1980).

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Authors
  1. M. T. Ryspaev
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Translated from Izmeritel'naya Tekhnika, No. 10, p. 20, October, 1984.

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Ryspaev, M.T. Measurement of the parameters of infralow-frequency voltages in the verification of profilometers and profilographs. Meas Tech 27, 895–896 (1984). https://doi.org/10.1007/BF00862304

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  • DOI: https://doi.org/10.1007/BF00862304

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