Measurement Techniques

, Volume 28, Issue 7, pp 580–583 | Cite as

Simulation used in metrological support

  • É. I. Tsvetkov
General Problems of Metrology and Measurement Techniques

Keywords

Physical Chemistry Analytical Chemistry Metrological Support 

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Literature cited

  1. 1.
    É. I. Tsvetkov, Izmer. Tekh., No. 9, 25 (1983).Google Scholar
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    E. I. Tzwetkov (Tsvetkov), Measurement,1, No. 3, 129.Google Scholar
  3. 3.
    All-Union State Standard (GOST) 8.009-72: The State System of Measurements: Standardized Metrological Characteristics of Means of Measurement [in Russian].Google Scholar
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    Yu. A. Zhelnov, Accuracy Characteristics of Control Computers [in Russian], Énergoatomizdat, Moscow (1983).Google Scholar
  5. 5.
    M. I. Pavlovich, E. B. Solov'eva, and V. S. Sobolev, in: Proceedings of the All- Union Symposium on Statistical Measurements [in Russian], Vol. 1, VNIIEP, Leningrad (1982), p. 50.Google Scholar
  6. 6.
    A. A. Pankrishkin et al., in: Abstracts for the Third All-Union Symposium on Dynamic Measurements [in Russian], VNIIM, Leningrad (1981), p. 138.Google Scholar

Copyright information

© Plenum Publishing Corporation 1985

Authors and Affiliations

  • É. I. Tsvetkov

There are no affiliations available

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