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Measurement Techniques

, Volume 28, Issue 7, pp 580–583 | Cite as

Simulation used in metrological support

  • É. I. Tsvetkov
General Problems of Metrology and Measurement Techniques

Keywords

Physical Chemistry Analytical Chemistry Metrological Support 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Literature cited

  1. 1.
    É. I. Tsvetkov, Izmer. Tekh., No. 9, 25 (1983).Google Scholar
  2. 2.
    E. I. Tzwetkov (Tsvetkov), Measurement,1, No. 3, 129.Google Scholar
  3. 3.
    All-Union State Standard (GOST) 8.009-72: The State System of Measurements: Standardized Metrological Characteristics of Means of Measurement [in Russian].Google Scholar
  4. 4.
    Yu. A. Zhelnov, Accuracy Characteristics of Control Computers [in Russian], Énergoatomizdat, Moscow (1983).Google Scholar
  5. 5.
    M. I. Pavlovich, E. B. Solov'eva, and V. S. Sobolev, in: Proceedings of the All- Union Symposium on Statistical Measurements [in Russian], Vol. 1, VNIIEP, Leningrad (1982), p. 50.Google Scholar
  6. 6.
    A. A. Pankrishkin et al., in: Abstracts for the Third All-Union Symposium on Dynamic Measurements [in Russian], VNIIM, Leningrad (1981), p. 138.Google Scholar

Copyright information

© Plenum Publishing Corporation 1985

Authors and Affiliations

  • É. I. Tsvetkov

There are no affiliations available

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