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Digital meter for silicon charge-carrier lifetime

  • Measurement of Electrical and Magnetic Quantities
  • Published:
Measurement Techniques Aims and scope

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Literature cited

  1. S. M. Ryvkin, Photoelectric Phenomena in Semiconductors [in Russian], GIFML, Moscow (1963).

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Authors
  1. A. I. Safronov
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Translated from Izmeritel'naya Tekhnika, No. 7, pp. 51–52, July, 1984.

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Safronov, A.I. Digital meter for silicon charge-carrier lifetime. Meas Tech 27, 636–638 (1984). https://doi.org/10.1007/BF00862136

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  • DOI: https://doi.org/10.1007/BF00862136

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