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Improved two-beam specular hemisphere method for measuring thermal radiation characteristics of scattering materials

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Abstract

The specular hemisphere method for measuring the transmittance and reflectance of light-scattering materials, which takes into account the spreading of the cross section of a narrow divergent beam of radiation in the specimen, the optical aberrations of the system, and the nonuniformity of the zonal sensitivity of the radiation detector, is examined.

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Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 32, No. 5, pp. 765–771, May, 1977.

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Il'yasov, S.G., Krasnikov, V.V., Tyurev, E.P. et al. Improved two-beam specular hemisphere method for measuring thermal radiation characteristics of scattering materials. Journal of Engineering Physics 32, 487–491 (1977). https://doi.org/10.1007/BF00860592

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  • DOI: https://doi.org/10.1007/BF00860592

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