Journal of engineering physics

, Volume 34, Issue 3, pp 315–320 | Cite as

Calculating semiconductor parameters based on measuring electrical and thermophysical, galvanic and thermomagnetic effects using the method of varying the influence factors

  • I. S. Lisker
  • M. B. Pevzner


The methods and the sequence for calculating the semiconductor parameters using the results of measuring the effects of a single experiment are examined. Algorithms for calculating the primary and secondary semiconductor parameters are proposed.


Statistical Physic Influence Factor Single Experiment Thermomagnetic Effect 
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Literature cited

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    I. S. Lisker, Calculable Systems [in Russian], 29th ed., Nauka, Novosibirsk (1968), p. 3.Google Scholar
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    I. S. Lisker and M. B. Pevzer, Inzh. -Fiz. Zh.,30, 1 (1976).Google Scholar
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    E. V. Kuchis, Methods for Investigating the Hall Effect [in Russian], Sovet-skoe Radio, Moscow (1974).Google Scholar
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    P. S. Kireev, Physics of Semiconductors [in Russian], Vysshaya Shkola, Moscow (1969).Google Scholar
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    I. M. Tsidil'kovskii, Thermomagnetic Phenomena in Semiconductors [in Russian], Fizmatgiz, Moscow (1960).Google Scholar
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    B. M. Askerov, Kinetic Effects in Semiconductors [in Russian], Nauka, Leningrad (1970).Google Scholar
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    J. R. Drabble and E. J. Goldschmidt, Thermal Conduction in Semiconductors, Pergamon (1961).Google Scholar

Copyright information

© Plenum Publishing Corporation 1978

Authors and Affiliations

  • I. S. Lisker
    • 1
  • M. B. Pevzner
    • 1
  1. 1.Scientific-Research Institute of Agricultural PhysicsLeningrad

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