Skip to main content
SpringerLink
Log in

Electrical properties and mechanism of electrical conductivity of ruthenium dioxide-base thick films

  • Methods of Investigation and Properties of Powder Materials
  • Published:
Soviet Powder Metallurgy and Metal Ceramics Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Literature cited

  1. M. P. Ansell, “Conduction processes in thick film resistors,” Electrocomponents Sci. Tech.,3, No. 3, 131–140 (1976).

    Google Scholar 

  2. G. Pike and C. Seager, “Electrical properties and conduction mechanisms of Ru-based thick film resistors,” J. Appl. Phys.,48, No. 12, 5152–5169 (1977).

    Google Scholar 

  3. P. F. Carcia, A. Feretti, and A. Suna, “Particle size effects in thick film resistors,” J. Appl. Phys.,53, No. 7, 5282–5288 (1982).

    Google Scholar 

  4. D. K. Paul and S. S. Mitra, “Evaluation of Mott's parameters for hopping conduction in amorphous Ge, Si, and Ge-Si,” Phys. Rev. Lett.,31, No. 16, 1000–1003 (1973).

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Institute of Problems of Material Science, Academy of Sciences of the Ukrainian SSR, Ukraine

    V. G. Grebenkina, D. E. Dyshel, M. D. Smolin & V. N. Fedorov

Authors
  1. V. G. Grebenkina
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. D. E. Dyshel
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. M. D. Smolin
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. V. N. Fedorov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Poroshkovaya Metallurgiya, No. 5(329), pp. 68–71, May, 1990.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Grebenkina, V.G., Dyshel, D.E., Smolin, M.D. et al. Electrical properties and mechanism of electrical conductivity of ruthenium dioxide-base thick films. Powder Metall Met Ceram 29, 396–399 (1990). https://doi.org/10.1007/BF00844963

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00844963

Keywords

Search

Navigation