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Thickness dependence of probe conductivity measurements for semiconductors

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Authors and Affiliations

  1. Gor'kii Technical Physics Research Institute, USSR

    A. I. Emel'yanov & V. L. Kon'kov

Authors
  1. A. I. Emel'yanov
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  2. V. L. Kon'kov
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Emel'yanov, A.I., Kon'kov, V.L. Thickness dependence of probe conductivity measurements for semiconductors. Soviet Physics Journal 10, 62–63 (1967). https://doi.org/10.1007/BF00843557

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  • DOI: https://doi.org/10.1007/BF00843557

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