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Interpretation of results of multifrequency measurements in checking multilayer dielectric structures

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Measurement Techniques Aims and scope

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Literature cited

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Authors
  1. E. L. Bartashevskii
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  2. O. O. Drobakhin
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  3. I. V. Slavin
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 6, pp. 31–33, June, 1984.

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Bartashevskii, E.L., Drobakhin, O.O. & Slavin, I.V. Interpretation of results of multifrequency measurements in checking multilayer dielectric structures. Meas Tech 27, 511–514 (1984). https://doi.org/10.1007/BF00838753

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  • DOI: https://doi.org/10.1007/BF00838753

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