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Some aspects of methods of making and examining thin metal films

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Abstract

Simple devices are described for making evaporated films and for examining their electrical parameters. Conditions are given for the preparation of nichrome films with specified parameters.

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References

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Authors and Affiliations

  1. Kiev Polytechnical Institute, USSR

    M. V. Belous, V. G. Permyakov & E. N. Severyanina

Authors
  1. M. V. Belous
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  2. V. G. Permyakov
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  3. E. N. Severyanina
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Belous, M.V., Permyakov, V.G. & Severyanina, E.N. Some aspects of methods of making and examining thin metal films. Soviet Physics Journal 8, 22–24 (1965). https://doi.org/10.1007/BF00838574

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  • DOI: https://doi.org/10.1007/BF00838574

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