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Apparatus for measuring the parameters of magnetic diffraction coatings

  • Opticophysical Measurements
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Measurement Techniques Aims and scope

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Literature cited

  1. A. M. Balbashov and A. Ya. Chervonenkis, Magnetic Materials for Microelectronics [in Russian], Énergiya, Moscow (1979).

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  2. M. M. Chervinskii et al., Magnetooptic Methods and Means of Determining Magnetic Characteristics of Materials [in Russian], Énergiya, Leningrad (1980).

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  3. V. A. Tabarin and A. V. Shtain, Izv. Vyssh. Uchebn. Zaved., Fizika, No. 10 (1977).

  4. G. F. Isaev et al., Inventor's Certificate No. 262428, Byull. Izobret., No. 6 (1970).

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Authors
  1. V. E. Kositsyn
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  2. V. A. Tabarin
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 6, pp. 46–47, June, 1983.

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Kositsyn, V.E., Tabarin, V.A. Apparatus for measuring the parameters of magnetic diffraction coatings. Meas Tech 26, 490–492 (1983). https://doi.org/10.1007/BF00831097

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  • DOI: https://doi.org/10.1007/BF00831097

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